film thickness, metrology, measurement, instrument, thin film, thick film, wafer thinning, backgrind, refractive index, ellipsometry, interferometry, reflectivity, spectrometer, oxide, photoresist, resist, uniformity, polymer, nitride, oxynitride, polyimide, BCB, SU-8, spin-on, low-k, a-silcon, polysilicon, amorphous silicon, dielectric, silicon, silicide, GaAs, mapping, wafer, semiconductor, plating, electroplating, advanced packaging, epitaxy, MEMS, magnetic disk, micromachining, flat panel display

KV-300 with full automation

  • Foothill has partnered with Kovis Engineering of Korea for automation
  • World-wide support for the automation provided by Kovis
  • System may be configured with numerous options per requirements
  • Options: AGV, RFID, barcode, prealign, OCR, edge grip, ….