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KV-300	Tabletop film thickness tool with vision for measuring transparent films of thickness up to 500 µm.
KF-10	Tabletop film thickness tool for measuring transparent films of thickness up to 160 µm.
L-2	Manual tabletop film thickness tool for measuring transparent films of thickness up to 150 µm.
Si-71	Tabletop metrology tool for measuring Si, GaAs, resist, ... of thickness range 20 µm to 500+ µm (Si) or > 1 mm of resist.  Ideal for process control of backthinned Si.
Inline	Above products are also available in component form to allow easy integration or clustering with other tools. Very compact design enables in-process metrology.

  © Foothill Instruments film thickness, metrology, wafer thinning, backgrind